Key research themes
1. How can buffer amplifier design be optimized for high driving capability, low power, and minimal offset voltage in large-size LCD applications?
This theme encompasses circuit-level innovations in buffer amplifier design targeting the high-speed, low-power, and low-offset requirements of large LCD displays, where driving large capacitive loads with rapid settling times and minimal power dissipation is critical. It focuses on CMOS amplifier topologies, positive feedback, slew-rate enhancement techniques, and transistor sizing techniques to achieve performance gains.
2. What circuit techniques can effectively enhance the transconductance in bulk-driven CMOS input stages to enable low-voltage and rail-to-rail operational amplifiers?
This research theme addresses the challenge of reduced effective transconductance in bulk-driven MOSFET input pairs—key in low-voltage, rail-to-rail operational amplifier design—by exploring circuit techniques that employ partial positive feedback to boost DC gain and bandwidth without significantly increasing power or area, thus enabling robust low-voltage analog circuit operation.
3. How does RTS noise from in-pixel source follower transistors impact CMOS image sensor readout circuits, and how can readout timing parameters be optimized for noise reduction?
This theme deals with the characterization and modeling of Random Telegraph Signal (RTS) noise arising mainly from the source follower transistors in CMOS image sensors, its influence on sensor noise performance and image quality especially at low light levels, and how correlated double sampling (CDS) timing parameters can be optimized to mitigate RTS noise impact, enhancing sensor readout accuracy.