Towards automated nanoassembly with the atomic force microscope: A versatile drift compensation procedure
Journal of Dynamic Systems, Measurement, and …, Jan 1, 2009
Résumé/Abstract While the atomic force microscope (AFM) was mainly developed to image the topogra... more Résumé/Abstract While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter the assembly of nano-objects, is a very promising technique for prototyping ...
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Papers by Florian Krohs