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In Fig. 4 is shown the dependence of gate capacitive effect in the so-called “worst case” conditions on area S (product between width and length channel), for parametric values of thickness of oxide layers (t,,). With the so-called “‘worst case” we understand the case when gate capacitive effect reaches its maximal value.

Figure 4 In Fig. 4 is shown the dependence of gate capacitive effect in the so-called “worst case” conditions on area S (product between width and length channel), for parametric values of thickness of oxide layers (t,,). With the so-called “‘worst case” we understand the case when gate capacitive effect reaches its maximal value.