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Figure 5 Cross-sectional view of memory array chambcr utilizing thermoelectric cooling. In another application, it was necessary to cool chips on wafers under test prior to dicing. To do this wafers were held on a water-coolcd platform by means of a vacuum. It was determined that in order to cool a chip under test it was nccessary to provide a water tempcra- ture of 20°C entering the platform. Cooling water was
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