Papers by Serge Demidenko
IMTC/04 : proceedings of the 21th IEEE Instrumentation and Measurement Technology Conference : Como, Italy-May 18-20, 2004 : from the electrometer to the networked instruments : a giant step toward a deeper knowledge
IEEE Service Center eBooks, 2004
IMTC/04 : proceedings of the 21th IEEE Instrumentation and Measurement Technology Conference : Como, Italy-May 18-20, 2004 : from the electrometer to the networked instruments : a giant step toward a deeper knowledge
I<sup>2</sup>MTC 2009 committee
2009 IEEE Instrumentation and Measurement Technology Conference, 2009
IEEE Transactions on Instrumentation and Measurement, 2021
Optical Sources
John Wiley & Sons, Inc. eBooks, Nov 7, 2011
Logic Built-In Self-Test Instrumentation System for Engineering Test Technology Education
A low-cost desktop system has been developed to train future electronic engineering specialists t... more A low-cost desktop system has been developed to train future electronic engineering specialists to the principles and implementation of Built-In Self-Test (BIST) techniques for digital semiconductor Integrated Circuits (ICs). It is based on the National Instruments LabView software and ELVIS modular engineering educational laboratory device. The system includes a configurable Pseudo-Random Test Generator (PRTG), programmable hardware logic Device Under Test (DUT) emulator, and test response compactor unit - Multiple-Input Signature Register (MISR) along with associated circuitry and relevant software. It is a part of the desktop platform for test engineering education - a family of compact low-cost systems specifically developed for training in test technology.
Special issue on IMTC'04 IEEE Transactions on Instrumentation and Measurement
Interactive System for Maintenance of Automatic Test Equipment on the IC Production Floor
Springer eBooks, 2022
Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore
SPIE eBooks, 2000
Mixed-Signal Test System for Education in Instrumentation and Measurement Technology
Microcontroller testing using on-load-board DAC
Microcontroller devices mass-produced by the industry often include built-in mixed-signal analog-... more Microcontroller devices mass-produced by the industry often include built-in mixed-signal analog-to-digital conversion circuitry. Testing of these converters embedded into an otherwise purely digital integrated circuit requires using additional equipment, extends test time, and ultimately leads to higher cost. A traditional test set-up would include Automatic Test Equipment (ATE) system as well as an external rack-and-stack device for analog-to-digital and digital-to-analog converter testing. This paper proposes to substitute this external device with a simple electronic circuitry placed on the ATE load-board.
Uncertainty propagation
IOP Publishing eBooks, Jun 1, 2023
Moment-based standard uncertainty in design optimisation
IOP Publishing eBooks, Jun 1, 2023
Probabilistic design optimisation
IOP Publishing eBooks, Jun 1, 2023
References 1-4 2 Uncertainty propagation 2-1 2.1 Averaging methods for estimating the measurand i... more References 1-4 2 Uncertainty propagation 2-1 2.1 Averaging methods for estimating the measurand in nonlinear models 2-2 2.2 First-order linearisation and the normality assumption 2-4 2.3 The Monte Carlo method 2-6 2.4 The use of a mathematical representation of the probability density function 2-7 2.5 Uncertainty evaluation using moments 2-7 2.5.1 The normal distribution 2-8 2.5.2 The Cornish-Fisher expansion 2-9 2.5.3 The extended generalised lambda distribution 2-9 2.5.4 Tukey's gh distribution 2-10 2.5.5 The Pearson distribution 2-11 2.5.6 The Johnson distribution 2-12 2.5.7 The maximum entropy method 2-13 2.6 Summary 2-14 References 2-14 3 Probabilistic design optimisation 3-1 3.1 Robust design optimisation 3-4 3.1.1 The univariate dimension reduction method 3-6 3.1.2 The performance moment integration method 3-6 3.2 Reliability-based design optimisation 3-7 3.2.1 Most probable point-based methods 3-8 3.2.2 The Monte Carlo method 3-12 3.2.3 Metamodels with direct sampling methods 3-14 3.2.4 Moment-based methods for RBDO 3-17 v 3.3 Reliability-based robust design optimisation 3-20 3.4 Summary 3-20 References 3-20 4 Moment-based standard uncertainty in design optimisation 4-1 4.1 The derivation of the analytical moments of multivariate polynomials 4-2 4.1.1 The Mellin transform and the product of independent random variables 4-3 4.1.2 Applying the Mellin transform to analytical moments of multivariate polynomials 4-6 4.1.3 Moment calculation for positive-order variables, ∈ + m 4-9 4.1.4 Moment calculation for negative-order variables, ∉ + m 4-10 4.1.5 Extension to high-dimensional correlated variables 4-12 4.2 A toolbox for moment-based standard uncertainty evaluation 4-13 4.3 Case studies for moment-based analytical standard uncertainty evaluation 4-14 4.3.1 Case study 1-monomial: magnetic force microscope 4-14 4.3.2 Case study 2-simple polynomial: microwave meter calibration 4-18 4.3.3 Case study 3-high-order Taylor series approximation: eddy current measurement 4-19 4.4 A general framework for analytical moment-based reliability and robustness analysis 4-21 4.5 Summary 4-23 References and further reading 4-23 5 Moment-based expanded uncertainty evaluation in design optimization 5-1 5.1 The improved moment-constrained maximum entropy method 5-2 5.1.1 Setting the zero mean and unit variance 5-3 5.1.2 Finding integral limits 5-3 5.1.3 The modified Gram-Schmidt algorithm for polynomial orthogonalisation 5-4 5.2 Test distributions for benchmarking and performance analysis 5-5 5.2.1 Unimodal distributions 5-6 5.2.2 Multimodal distributions 5-7 5.2.3 A performance assessment framework that uses the benchmark test distributions 5-10 Analytical Evaluation of Uncertainty Propagation for Probabilistic Design Optimisation vi 5.3 Reliability analysis of parametric distribution-fitting techniques: from unimodal to multimodal distributions 5-12 5.3.1 Unimodal distributions with four moments 5-13 5.3.2 Unimodal distributions with more than four moments 5-17 5.3.3 Multimodal distributions 5-19 5.3.4 Reliable regions for Tukey's gh method and the Cornish-Fisher technique 5-20 5.4 A toolbox for the MaxEnt algorithm 5-21 5.5 Summary 5-24 References 5-24 6 Real-world design optimisation problems: applications and usefulness 6-1 6.1 The framework for probabilistic design optimisation 6-1 6.1.1 Local response surface modelling using multivariate polynomials 6-3 6.1.2 The selective sampling technique 6-3 6.2 Lithium-ion batteries: a reliability-based design optimisation framework 6-4 6.2.1 The finite element model of the lithium-ion battery 6-5 6.2.2 Incorporating moment-based uncertainty evaluation 6-7 6.2.3 The resultant design 6-8 6.3 Vehicle design based on side-impact crashworthiness: the application of a reliability-based robust design optimisation problem 6-10 6.3.1 Problem formulation 6-10 6.3.2 Resultant design 6-11 6.4 Fuel cells: parameter optimisation for reliable and robust operation 6-12 6.4.1 Problem formulation 6-14 6.4.2 Sensitivity analysis 6-16 6.4.3 Determination of the optimal operating conditions for RBDO and RBRDO 6-17 6.5 Magnetic sensor module design 6-19 6.5.1 Problem formulation 6-20 6.5.2 The results of the PolyMoment-based RBDO method 6-22 6.6 A multistorey three-dimensional steel structure: reliability analysis and optimisation 6-22 6.6.1 Problem formulation 6-23 6.6.2 The resultant design and benchmarking 6-25
Moment-based expanded uncertainty evaluation in design optimization
IOP Publishing eBooks, Jun 1, 2023
Real-world design optimisation problems: applications and usefulness
IOP Publishing eBooks, Jun 1, 2023
Control 1991. Control '91., International Conference on, Mar 25, 1991
GENERAL OBJECTIVES Testing is one of the most important steps in creating reliable and durable pr... more GENERAL OBJECTIVES Testing is one of the most important steps in creating reliable and durable prototypes of high-performance machinery. It is also crucially important in the operational development of finished production prototypes. The objectives of testing are. to provide for complete simulation of all possible stresses on a product in service and to analyse the product's behaviour and performance under service conditions. Essentially the stress factors are linear and angular acceleration, impacts, vibration, acoustic environment and climate.
<title>Microelectronic component of an information and telecommunication degree</title>
Proceedings of SPIE, Sep 29, 1999
ABSTRACT
Design and analysis of RAM transparent March test for BIST implementation
Proceedings of SPIE, Oct 24, 2000
Design and analysis of RAM transparent March test for BIST implementation. [Proceedings of SPIE 4... more Design and analysis of RAM transparent March test for BIST implementation. [Proceedings of SPIE 4228, 358 (2000)]. Serge N. Demidenko, Scott A. Henderson. Abstract. New transparent memory test algorithms for semiconductor ...
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Papers by Serge Demidenko