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Table showing the expected and actual amounts of the elements in composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo,.04)03 using X-ray fluorescence spectroscopy.

Table 1 showing the expected and actual amounts of the elements in composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo,.04)03 using X-ray fluorescence spectroscopy.

Related Figures (7)

Fig. 1. Schematic of the four-point bending measurement setup with single edge V-edge beam (SEVNB) specimen.
Fig. 1. Schematic of the four-point bending measurement setup with single edge V-edge beam (SEVNB) specimen.
Fig. 2. SEM micrograph of KNN composition 1 (Ko.44Nao.52Lio.o4)(Nbo.s6Tao,10Sbo.04) O3 ceramics. The X-ray diffraction patterns for the samples are shown in
Fig. 2. SEM micrograph of KNN composition 1 (Ko.44Nao.52Lio.o4)(Nbo.s6Tao,10Sbo.04) O3 ceramics. The X-ray diffraction patterns for the samples are shown in
Fig. 3. X-ray diffraction patterns for composition 1 (Ko,44Naosz2Lioo4) (Nbo.s6Tao.10Sbo.04)03 and composition 2 (Ko.43Nao.ss3Lio.o4)(Nbo.g4Tao.10Sbo.06)03 ceramics measured at room temperature.
Fig. 3. X-ray diffraction patterns for composition 1 (Ko,44Naosz2Lioo4) (Nbo.s6Tao.10Sbo.04)03 and composition 2 (Ko.43Nao.ss3Lio.o4)(Nbo.g4Tao.10Sbo.06)03 ceramics measured at room temperature.
Fig. 4. Force-displacement curves for (a) composition 1 (Ko.44Nao.s2Lio.o4)(Nbo.g6Tao.10Sb0.04)03 and (b) composition 2 (Ko.43Nao.53Lio.o4)(Nbo.s4Tao.10Sbo.06)03 ceramics. Th samples were measured using the semi-automatic mode of the four point bending machine. The second digit in the legend indicates the sample number for the sam composition.
Fig. 4. Force-displacement curves for (a) composition 1 (Ko.44Nao.s2Lio.o4)(Nbo.g6Tao.10Sb0.04)03 and (b) composition 2 (Ko.43Nao.53Lio.o4)(Nbo.s4Tao.10Sbo.06)03 ceramics. Th samples were measured using the semi-automatic mode of the four point bending machine. The second digit in the legend indicates the sample number for the sam composition.
Fig. 5. Fracture toughness (R-curve) as a function of crack length of three samples each for (a) composition 1 (Ko.44Nao.s2Lio.04)(Nbo.s6Ta0.10Sbo,.04)03 and (b) composition 2 (Ko.43Nao,53Lio,.04)(NDo.34Tao,10Sbo,06)03 ceramics. The second digit in the legend indicates the sample number for the same composition.
Fig. 5. Fracture toughness (R-curve) as a function of crack length of three samples each for (a) composition 1 (Ko.44Nao.s2Lio.04)(Nbo.s6Ta0.10Sbo,.04)03 and (b) composition 2 (Ko.43Nao,53Lio,.04)(NDo.34Tao,10Sbo,06)03 ceramics. The second digit in the legend indicates the sample number for the same composition.
Fig. 6. A plot of polarization against electric field for (a) composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo.04)03 and (b) composition 2 (Ko.43Nao.53Lio.04)(Nbo.g4Tao.10Sb0.06)O3 ceramics. The second digit in the legend indicates the sample number for the same composition.
Fig. 6. A plot of polarization against electric field for (a) composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo.04)03 and (b) composition 2 (Ko.43Nao.53Lio.04)(Nbo.g4Tao.10Sb0.06)O3 ceramics. The second digit in the legend indicates the sample number for the same composition.
Fig. 7. A plot of strain against electric field for (a) composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo.04)03 and (b) composition 2 (Ko.43Nao.53Lio.o4)(Nbo.g4Tao.10Sb0.06)O: ceramics. An electric field of 20 kV/cm was used for composition 1 while a field of 17.5 kV/cm was used for composition 2. The second digit in the legend indicates the sample number for the same composition.
Fig. 7. A plot of strain against electric field for (a) composition 1 (Ko.44Nao.52Lio.04)(Nbo.s6Tao.10Sbo.04)03 and (b) composition 2 (Ko.43Nao.53Lio.o4)(Nbo.g4Tao.10Sb0.06)O: ceramics. An electric field of 20 kV/cm was used for composition 1 while a field of 17.5 kV/cm was used for composition 2. The second digit in the legend indicates the sample number for the same composition.
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EngineeringMaterials ScienceCeramicsFracture Toughness
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