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Figure 4. The magnetic field distribution (scalar plot) obtained for one IA with a ferrite positionned at a distance d=1mm. Figure 3. Measured and simulated coupling factor for BS as function of horizontal misalignement (dy) between two IAs surrounding by ferrite (Fig. 1 c, dz=5 mm). Measurement (continous line) with 3Q load (square marker) or with 10M© load (triangle marker). Simulation (FEKO, dotted line) with 3Q load (square marker) or with 10OMQ load (circular marker)

Figure 4 The magnetic field distribution (scalar plot) obtained for one IA with a ferrite positionned at a distance d=1mm. Figure 3. Measured and simulated coupling factor for BS as function of horizontal misalignement (dy) between two IAs surrounding by ferrite (Fig. 1 c, dz=5 mm). Measurement (continous line) with 3Q load (square marker) or with 10M© load (triangle marker). Simulation (FEKO, dotted line) with 3Q load (square marker) or with 10OMQ load (circular marker)

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A prototype (already manufactured and characterized) available at Continental Automotive Toulouse was retro- simulated inside FEKO and HFSS in order to check the validity of the proposed approach. This benchmark structure (BS) manufactured on a square FR4 PCB (60 mm wide, substrate thickness h=1.6 mm), consists of a hollow spiral (Fig. 1) with following geometrical parameters: metallization thickness t=35um, inner radius Ir=10.5mm, outer radius Or=21.85mm, turns n=10, cooper strip width w=0.85mm, gap between strips g=0.2 mm. It’s a two layers structure with two identical hollow spirals located on top and on bottom side of the PCB. BS was simulated alone (Fig 1 a), two BSs in face to face configuration (Fig 1b), 2 BSs in face to face configuration with a shielding ferrite layer placed outside (Fig Ic). Figure 1. Benchmark structures: a) IA only (top view), b) two IAs, c) two IAs shielded by a ferrite
A prototype (already manufactured and characterized) available at Continental Automotive Toulouse was retro- simulated inside FEKO and HFSS in order to check the validity of the proposed approach. This benchmark structure (BS) manufactured on a square FR4 PCB (60 mm wide, substrate thickness h=1.6 mm), consists of a hollow spiral (Fig. 1) with following geometrical parameters: metallization thickness t=35um, inner radius Ir=10.5mm, outer radius Or=21.85mm, turns n=10, cooper strip width w=0.85mm, gap between strips g=0.2 mm. It’s a two layers structure with two identical hollow spirals located on top and on bottom side of the PCB. BS was simulated alone (Fig 1 a), two BSs in face to face configuration (Fig 1b), 2 BSs in face to face configuration with a shielding ferrite layer placed outside (Fig Ic). Figure 1. Benchmark structures: a) IA only (top view), b) two IAs, c) two IAs shielded by a ferrite
EI. EXPERIMENTAL AND SIMULATION RESULTS FOR BS A 25% variation (25%) of ferrite relative magnetic permeabilitty (standard value ur=800) was taken into account for simulation: no major impact on input impedance was observed. The voltage coupling factor (simulated and measured) obtained with two typical loads: 1OMQ (for an open circuit) and 3Q (for a battery) is shown in Fig. 2 and Fig. 3 respectively. A good correlation between simulation and measurement was observed proving that magnetic field is wel computed. The magnetic field distribution simulated for one IA with a ferrite positioned behind is represented in Fig. 4 and Fig. 5 respectively. We note that the shielding effect of the ferrite is well illustrated (the magnetic field for negative z coordinates is very week).
EI. EXPERIMENTAL AND SIMULATION RESULTS FOR BS A 25% variation (25%) of ferrite relative magnetic permeabilitty (standard value ur=800) was taken into account for simulation: no major impact on input impedance was observed. The voltage coupling factor (simulated and measured) obtained with two typical loads: 1OMQ (for an open circuit) and 3Q (for a battery) is shown in Fig. 2 and Fig. 3 respectively. A good correlation between simulation and measurement was observed proving that magnetic field is wel computed. The magnetic field distribution simulated for one IA with a ferrite positioned behind is represented in Fig. 4 and Fig. 5 respectively. We note that the shielding effect of the ferrite is well illustrated (the magnetic field for negative z coordinates is very week).
Figure 2. Measured and simulated coupling factor for BS as function of vertical distance (dz) between two IAs sourrounded by ferrite (Fig. 1 c, dy=0 mm). Measurement (continous line) with 3Q load (diamond marker) or with 10MQ load (triangle marker). Simulation (FEKO, dotted line) with 3Q load (square marker) or with 1OMQ load (circular marker)
Figure 2. Measured and simulated coupling factor for BS as function of vertical distance (dz) between two IAs sourrounded by ferrite (Fig. 1 c, dy=0 mm). Measurement (continous line) with 3Q load (diamond marker) or with 10MQ load (triangle marker). Simulation (FEKO, dotted line) with 3Q load (square marker) or with 1OMQ load (circular marker)
Figure 5. The magnetic field distribution (vectorial plot) obtained for one IA with a ferrite positionned at a distance d=1mm.
Figure 5. The magnetic field distribution (vectorial plot) obtained for one IA with a ferrite positionned at a distance d=1mm.
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EngineeringElectrical EngineeringPrinted Circuit BoardWireless Power Transfer
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