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Figure N.° 5. Pb and Sb containing-fine particle: (a) BSE image; (b) spectrum of the point analysis by EDS.

Figure 5 N.° 5. Pb and Sb containing-fine particle: (a) BSE image; (b) spectrum of the point analysis by EDS.

Related Figures (8)

Figure N.° 2. FE-SEM images created using the different electron detec- tors: (a) BSE image; (b) E-T SE image; (c) In-lens SE image.
Figure N.° 2. FE-SEM images created using the different electron detec- tors: (a) BSE image; (b) E-T SE image; (c) In-lens SE image.
Figure N.° 3. E-T SE images created under different magnifications: (a) x 2000; (b) x 20000; (c) x 100000.
Figure N.° 3. E-T SE images created under different magnifications: (a) x 2000; (b) x 20000; (c) x 100000.
Figure N.° 4. In-lens SE image created under high magnification.
Figure N.° 4. In-lens SE image created under high magnification.
Figure N.° 6. Pb containing-fine particle: (a) BSE image; (b) In-lens SE image; (c) spectrum of the point analysis by EDS.
Figure N.° 6. Pb containing-fine particle: (a) BSE image; (b) In-lens SE image; (c) spectrum of the point analysis by EDS.
Figure N.° 7. Fe and As containing-fine particle: (a) BSE image; (b) In-lens SE image; (c) spectrum of the point analysis by EDS.
Figure N.° 7. Fe and As containing-fine particle: (a) BSE image; (b) In-lens SE image; (c) spectrum of the point analysis by EDS.
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