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Figure 3: A single phase phase-angle control with resistive load and AIPFC. Table 1: Simulation results for the circuit given in figure 3.

Figure 3 A single phase phase-angle control with resistive load and AIPFC. Table 1: Simulation results for the circuit given in figure 3.

Related Figures (13)

Figure 1 shows the block diagram of the AIPFC connected between node a and node b. It contains of five boxes that represent system to make the desired effect of the variable capacitive impedance. The operation of the system is starting with a current sensor to measure the zero crossing time of the current in the branch a-b and then to determine reference waveform. In this part either a current transformer can be used to measure the current in the branch a-b or a resistor with a value of 1Q can be used to measure the voltage across it (it will be the same as a current waveform according to the ohm’s law). The output signal from the current sensor circuit is then passed to the shift delay circuit box. A shift delay circuit is the main part of the system
Figure 1 shows the block diagram of the AIPFC connected between node a and node b. It contains of five boxes that represent system to make the desired effect of the variable capacitive impedance. The operation of the system is starting with a current sensor to measure the zero crossing time of the current in the branch a-b and then to determine reference waveform. In this part either a current transformer can be used to measure the current in the branch a-b or a resistor with a value of 1Q can be used to measure the voltage across it (it will be the same as a current waveform according to the ohm’s law). The output signal from the current sensor circuit is then passed to the shift delay circuit box. A shift delay circuit is the main part of the system
The output signal from the phase shift delay circuit is then compared with a triangular waveform to generate PWM gate signals for the inverter circuit. Finally, the output signal is injected to the main system by using a shunt transformer as shown in the circuit diagram of figure 2. Therefore, the injected voltage signal can have the effect of any type of the impedance (resistive, inductive or capacitive) in the circuit. In addition, the magnitude of the effected impedance can be varied or controlled by varying the modulation index of the PWM waveform.
The output signal from the phase shift delay circuit is then compared with a triangular waveform to generate PWM gate signals for the inverter circuit. Finally, the output signal is injected to the main system by using a shunt transformer as shown in the circuit diagram of figure 2. Therefore, the injected voltage signal can have the effect of any type of the impedance (resistive, inductive or capacitive) in the circuit. In addition, the magnitude of the effected impedance can be varied or controlled by varying the modulation index of the PWM waveform.
Figure 5: A single phase phase-angle control with RL load and AIPFC. It can be seen from Table 2 and Figure 6 that the same results have been recorded when the load was resistive in terms of improving the Input Power Factor (PFi,) and the Total Harmonic Distortion (THD). Therefore, more improvement can be recorded if the modulation index (M) is increased and this is because the percentage of the capacitive compensation will be increased.
Figure 5: A single phase phase-angle control with RL load and AIPFC. It can be seen from Table 2 and Figure 6 that the same results have been recorded when the load was resistive in terms of improving the Input Power Factor (PFi,) and the Total Harmonic Distortion (THD). Therefore, more improvement can be recorded if the modulation index (M) is increased and this is because the percentage of the capacitive compensation will be increased.
Figure 4: Simulation results for the circuit given in figure 3. International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016
Figure 4: Simulation results for the circuit given in figure 3. International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016
Figure 6: Simulation results for the circuit given in figure 5. Table 2: Simulation results for the circuit given in figure 5.
Figure 6: Simulation results for the circuit given in figure 5. Table 2: Simulation results for the circuit given in figure 5.
Figure 7: Experimental c ircuit with AIPFC. Figure 7 represents the experimental circuit which consists of a voltage source feeding RL load with Active Impedance Power Factor Correction (AIPFC). Practically, the AIPFC consists of an Integrated Circuit, Microcontroller (PIC16F877A), Interfacing Circuit, and a Voltage Source Inverter (V SI). The operation of this figure will as following:
Figure 7: Experimental c ircuit with AIPFC. Figure 7 represents the experimental circuit which consists of a voltage source feeding RL load with Active Impedance Power Factor Correction (AIPFC). Practically, the AIPFC consists of an Integrated Circuit, Microcontroller (PIC16F877A), Interfacing Circuit, and a Voltage Source Inverter (V SI). The operation of this figure will as following:
Figure 8: (a) Integrated circuit, (b) Input and output waveforms of the integrator circuit. It is used to sense the current waveform from the branch at which the AIPFC is connected. This current waveform is then integrated (shifted be 90°) and connected to the input of the Microcontroller (PIC16F877A). Figure 8(a) shows the integrated circuit and figure 8(b) shows the input and output waveforms of the integrator circuit.
Figure 8: (a) Integrated circuit, (b) Input and output waveforms of the integrator circuit. It is used to sense the current waveform from the branch at which the AIPFC is connected. This current waveform is then integrated (shifted be 90°) and connected to the input of the Microcontroller (PIC16F877A). Figure 8(a) shows the integrated circuit and figure 8(b) shows the input and output waveforms of the integrator circuit.
Figure 9: (a) A microcontroller PIC16F877A chip, (b) Output waveforms from Ports B and C. A microcontroller PIC16F877A chip shown in figure 9(a) has been used to generate gate signals for the inverter switches. In this case, a program written and loaded to the microcontroller in order to read the input signals from its port A and generates output signals at its ports B and C. The main function of this program is to compare between the two input signals (a triangular wave and output signal from the integrated circuit) and to generate two PWM signals at the output ports (B and C) of the microcontroller as shown in figure 9(b). In addition, the dead time between the two outputs signals generated by the microcontroller is also included in the program as shown in figure 10.
Figure 9: (a) A microcontroller PIC16F877A chip, (b) Output waveforms from Ports B and C. A microcontroller PIC16F877A chip shown in figure 9(a) has been used to generate gate signals for the inverter switches. In this case, a program written and loaded to the microcontroller in order to read the input signals from its port A and generates output signals at its ports B and C. The main function of this program is to compare between the two input signals (a triangular wave and output signal from the integrated circuit) and to generate two PWM signals at the output ports (B and C) of the microcontroller as shown in figure 9(b). In addition, the dead time between the two outputs signals generated by the microcontroller is also included in the program as shown in figure 10.
Figure 10: The dead time between the two outputs signals at ports B and C. International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016 4.3 Interfacing Circuit
Figure 10: The dead time between the two outputs signals at ports B and C. International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016 4.3 Interfacing Circuit
4.3.1 Opto-coupler Circuit
4.3.1 Opto-coupler Circuit
Figure 13: Inverter output voltage waveform. Figure 12: Voltage source inverter with its driver circuit.
Figure 13: Inverter output voltage waveform. Figure 12: Voltage source inverter with its driver circuit.
International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016
International Journal of Microelectronics Engineering (IJ ME), Vol.2, No.1,January 2016
Table 3: Experimental results for the circuit given in figure 7.
Table 3: Experimental results for the circuit given in figure 7.
Related topics:
MicroelectronicsSemiconductor Devices(nano & Micro Electronics)Micro Electronicstotal harmonic distortion (THD)Power Factor Correction
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