Textured strontium ferrite thin films grown by PLD

Journal of Magnetism and Magnetic Materials, 1996

Journal of Physics: Conference Series, 2012

Ba 2+ Fe 12 O 19 (BaO.6Fe 2 O 3) films have been grown on (0001) sapphire substrate using pulsed laser deposition (PLD) technique. Prepared films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), X-ray reflectivity (XRR), atomic force microscopy (AFM) and magnetic measurements. XRD confirms the formation of Ba 2+ Fe 12 O 19 phase, whereas presence of Fe 2 O 3 was also identified. X-ray photoelectron spectroscopy (XPS) shows the signature of all the elements present in the barium ferrite. XRR data show the thickness of the film is ~ 24.2 nm with top layer roughness of ~ 3.7 nm. AFM measurement suggests the formation of clusters with average roughness of ~ 3.9 nm. Magnetic measurements of the target reveal its anisotropic nature with coercivity values: 0.23 and 0.24 T, obtained along two orthogonal directions. For the prepared thin film, the obtained coercivity ~80 mT and saturation induction 0.13 T are lower than the usual values obtained for Ba 2+ Fe 12 O 19 compound (coercivity and saturation induction values are 0.19 Tesla and 0.48 T respectively), can be ascribed to the presence of Fe 2 O 3 phase.

2012

Thin film of Cobalt Ferrite was deposited on Si (1 0 0) substrate using Pulsed Laser Deposition (PLD) technique. The deposited film was characterized by X-ray Diffraction (XRD), X-ray reflectivity (XRR), Rutherford Backscattering Spectroscopy (RBS) and Raman Spectroscopy and was found to be single phase, textured along (1 1 1) directions and approximately matching the stoichoimetry of the target with negligible strain. The film had a very uniform and flat surface. Raman spectroscopy measurement further confirmed the formation of single phase cubic spinel structure. T 2g Raman mode was missing from the spectra which may be due to cation redistribution and crystallite size effect.

IEEE Transactions on Magnetics, 2006

We present a new technique to improve growth of ferrite films by pulsed laser deposition (PLD). The technique utilizes a metal screen placed between target and substrate, effectively to impede formation of large particulates on the surface of ferrite films by changing the plume shape and plasma density in the PLD chamber. Structural, magnetic, electrical, and microwave properties were measured for the flux screened and conventionally grown films. We demonstrate that the flux screen deposited MnZn-ferrite film has a lower coercivity (39 versus 58 Oe) and ferromagnetic resonance linewidth (350 versus 430 Oe at 9.58 GHz). The improvement in magnetic properties is associated with a reduction in large particulate contamination. This simple approach has the potential to produce high-quality ferrite films for use in electronic and microwave devices.

Journal of Optoelectronics and Advanced Materials, 2005

Thin Ni 0.5 Zn 0.5 Fe 2 O 4 ferrite films were grown on different condition on different substrates using pulsed laser deposition technique. Studying the influence of the energy of the laser beam, of the O 2 pressure, of the substrate temperature, and of the distance between the target and the substrate on the microstructure and on the magnetic properties were established optimal conditions for PLD of ferrite thin film on silicon. The microstructure of the thin films was characterized by SEM, EDS, AFM and XRD analysis. The magnetic properties were inferred from vibrating sample measurements. The magnetic behavior of the samples was interpreted in terms of the role played by post annealing condition on the microstructure.

Micromachines, 2021

The paper is focused on the development and optimization of strontium ferrite nanomaterial and photosintered flexible thin films. These magnetic thin films are characterized with direct current (DC) and high frequency measurements. For photosintered strontium ferrite samples, we achieved relative complex permeability of about 29.5-j1.8 and relative complex permittivity of about 12.9-j0.3 at a frequency of 5.9 GHz.

American Journal of Applied Sciences, 2005

Thin films of irradiated and non-irradiated Co-Zn ferrite was prepared by the thermal evaporation method on a glass substrate. The samples were annealed at 200°C, 400°C and 600°C for 1hr. The XRD analysis of all kinds of films, prepared for this study, shows that the spinel phase is almost completed after annealing. The change of the XRD after annealing is explained by the change of the relative quantities of the various magnetic phases (spinel and oxides) present before and after the annealing process. After annealing at 600°C, the material shows a spinel phase with lattice constant 8.30 A° for normal samples and 8.38 A° for the irradiated ones, respectively. After laser irradiation, the XRD pattern indicates the formation of a distorted spinel structure besides the spinel phase. A metallic behavior with temperature was observed in the two samples, irradiated and non-irradiated. The resistance of the sample was found to decrease by annealing process which may be due to the decrease in the number of grain boundaries.

Materials Research Bulletin, 2015

Patterned nano crystalline ZnFe 2 O 4 thin film was fabricated on quartz substrate by pulse laser deposition. XRD and Raman spectroscopic techniques were employed for structural characterization of the film. Silencing of a small number of prominent ferrite XRD peaks in thin film signify mild textured film growth. The observed XRD peak position swing with respect to the target material in thin film indicates formation of lateral strain in opposite directions during film growth. The thin film XRD peak position shift with target material data as reference is explained by suggesting an appropriate film growth model. Designated ferrite Raman emission peaks originated from film surface authenticates the stoichiometric and structural stability of ferrite material. AFM images indicate specific pattern formation with nanogranular morphology. Magnetic property measurements of the thin film revealed enhanced properties which are explained on the basis of texture, lattice strain, and surface features that are originated from patterned thin film growth.

Applied Physics A, 2013

CoFe 2 O 4 thin films with preferential texture structure, small grain size, and perpendicular magnetic anisotropy can be obtained by the pulsed laser deposition (PLD) technique. In this work, we studied the influence of the Fe 3+ ions substitution by three elements from lanthanide group (Dy, La, and Gd) on the structural properties of the thin films. The samples were deposited by Nd:YAG laser (λ = 532 nm, 10 ns) ablation of CoFe 1.8 RE 0.2 O 4 , (RE = Dy, La, Gd) targets at various substrate temperatures ranging from room temperature to 600°C. The microstructure and chemical composition of the thin films were investigated by Raman spectroscopy, XRD, SEM-EDS, and ToF-SIMS. The XRD patterns and Raman spectra of the thin films indicated the formation of a single spinel structure. Thus, the desired substitution of the iron ions in the spinel lattice with the RE elements was achieved in the thin films, although in the bulk material, their presence determined the formation of a residual phase with a perovskite-type structure.

1988